Automatic system for detecting counterfeit, re-labeled or faulty electronic components in BGA enclosures.
The system combines an automatic optical component pin recognition system and a flying probe for conducting electrical testing by a safe method of analog signature analysis. All you need to find faults on the test chips is the removed volt–ampere characteristics (signatures) of the reference chips and our EyePoint B10 system. You will get a high-quality result in a few minutes.